Ho, P. S.

著者名典拠詳細を表示

著者の属性 個人
一般注記 Thin films and interfaces, c1982 (a.e.) CIP t.p. (P.S. Ho; IBM, T.J. Watson Res. Cent., Yorktown Heights, N.Y.)
Thin films, c1986: CIP t.p. (P.S. Ho) pref. (signed: Paul S. Ho)
Editor : Stress-induced phenomena in metallization, c1992: t.p. (Paul Ho)
から見よ参照 Ho, Paul S.
Ho, Paul
コード類 典拠ID=AU40065361  NCID=DA01675942
1 Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho Pittsburgh, Pa. : Materials Research Society , c1991
2 Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A. / editors, P.S. Ho, K.N. Tu New York : North-Holland , c1982